- emission spectrometry
- spectrométrie d'émission
English-French dictionary of labour protection . 2015.
emission spectrometry
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Inductively Coupled Plasma Emission Spectrometry — Inductively Coupled Plasma Emission SpectrometryA test method of quantitative identification of the elements, Aluminium, Silicon, Sodium, Vanadium, Nickel, Iron, Calcium, Zinc and Phosphorus in residual fuel oils.A weighted test sample is… … Wikipedia
mass spectrometry — or mass spectroscopy Analytic technique by which chemical substances are identified by sorting gaseous ions by mass using electric and magnetic fields. A mass spectrometer uses electrical means to detect the sorted ions, while a mass spectrograph … Universalium
Inductively coupled plasma atomic emission spectroscopy — (ICP AES), also referred to as inductively coupled plasma optical emission spectrometry (ICP OES), is an analytical technique used for the detection of trace metals. It is a type of emission spectroscopy that uses the inductively coupled plasma… … Wikipedia
Atomic emission spectroscopy — (AES) is a method of chemical analysis that uses the intensity of light emitted from a flame, plasma, arc, or spark at a particular wavelength to determine the quantity of an element in a sample. The wavelength of the atomic spectral line gives… … Wikipedia
Optical Emission Spectrometer — Atomspektroskopie (auch Atomspektrometrie) ist ein Sammelbegriff für spektroskopische Verfahren, die zur quantitativen und qualitativen Bestimmung von Elementen eingesetzt werden. Die Atomspektroskopie ist ein Teilbereich der Analytischen Chemie … Deutsch Wikipedia
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Inductively coupled plasma mass spectrometry — ICP MS Instrument Acronym ICP MS Classification Mass spectrometry Analytes atomic and polyatomic species in plasma, with exceptions; usually inte … Wikipedia
Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… … Wikipedia
Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… … Wikipedia
Mass spectrometry — (MS) is an analytical technique that measures the mass to charge ratio of charged particles.[1] It is used for determining masses of particles, for determining the elemental composition of a sample or molecule, and for elucidating the chemical… … Wikipedia
Journal of Analytical Atomic Spectrometry — Infobox Journal title = JAAS discipline = analytical chemistry abbreviation = JAAS JAAS (Cambridge, UK) website = http://www.rsc.org/publishing/journals/ja/ publisher = Royal Society of Chemistry country = United Kingdom history = 1986 to present … Wikipedia
